Spectrometry device, image forming apparatus, and spectrometry method

ABSTRACT

A printer that incorporates a spectrometry device includes a spectroscope, a distance measurer, and a spectrometry unit. The spectroscope includes a wavelength-selective interference filter on which light from a position of measurement in a medium is incident. The distance measurer measures the distance between the position of measurement and the spectroscope, and the spectrometry unit performs spectrometry at the position of measurement by using the spectroscope and correct a measured value obtained by the spectrometry based on the measured distance.

BACKGROUND

1. Technical Field

The present disclosure relates to a spectrometry device, an imageforming apparatus, and a spectrometry method.

2. Related Art

In the related art, in an image forming apparatus such as a printer,there is known a device that includes a colorimeter measuring the colorof an image recorded on a medium. See, for example, JP-A-2013-238755.

The device disclosed in JP-A-2013-238755 includes a recording head thatforms (prints) an image on a medium and a colorimetric sensor formeasuring the color of the image on the medium. The recording head andthe colorimetric sensor are disposed separately, and the colorimetricsensor is pressed by a pressing plate to perform colorimetry on themedium.

The distance between the colorimetric sensor and the medium may bechanged by, for example, a ripple on the medium or distortion of atransport path of the medium. As such, if the distance between thecolorimetric sensor and the medium is changed, a light intensitydistribution is changed at a position of measurement (i.e., in a rangeof measurement) where the colorimetric sensor performs colorimetry.

For example, if a colorimetry process is performed by irradiating themedium with light from a light source at an angle of incidence of 0° anddetecting light reflected at an angle of reflection of 45° with thecolorimetric sensor, the position of measurement is changed by a changein the distance between the colorimetric sensor and the medium. Thelight from the light source with which the medium is irradiated has alarge intensity in the central portion thereof and a small intensity inthe peripheral portion thereof. Thus, if the position of measurement isshifted, the light intensity distribution at the position of measurementis changed.

In addition, if the colorimetry process is performed by irradiating themedium with light from the light source at an angle of incidence of 45°and detecting light reflected at an angle of reflection of 0° with thecolorimetric sensor, a position of irradiation with light from the lightsource is changed by a change in the distance between the colorimetricsensor and the medium. As described above, since the light from thelight source with which the medium is irradiated has a large intensityin the central portion thereof and a small intensity in the peripheralportion thereof, the light intensity distribution at the position ofmeasurement is changed if the position of irradiation is changed.

As such, if the light intensity distribution at the position ofmeasurement is changed (e.g., decreased), the intensity of lightreceived by the colorimetric sensor is also decreased, and measurementaccuracy (i.e., color difference ΔE) is decreased if the colorimetryprocess is performed based on the measured intensity of received light.

SUMMARY

An advantage of some aspects of the present disclosure is to provide aspectrometry device, an image forming apparatus, and a spectrometrymethod capable of performing a high accuracy spectrometry process.

According to an application example of the present disclosure, there isprovided a spectrometry device that includes a spectroscope, a distancemeasurer, and a spectrometry unit. The spectroscope includes aspectroscopy element on which light from a measurement target isincident. The distance measurer measures the distance between themeasurement target and the spectroscope, and the spectrometry unitperforms spectrometry on the light by using the spectroscope. Thespectrometry unit further corrects a measured value obtained during thespectrometry based on the measured distance.

In the application example, the distance measurer measures the distancebetween the measurement target and the spectroscope, and thespectrometry unit corrects, based on the distance, the measured valueobtained at the time of performing spectrometry on the measurementtarget using the spectroscope. Accordingly, even if the distance betweenthe measurement target and the spectroscope is changed, a high accuracycolorimetry process can be performed by correcting the measured valueaccording to the distance.

In the spectrometry device of the application example, the spectroscopeincludes a light source that emits illumination light to the measurementtarget, and the light reflected by the measurement target is incident onthe spectroscopy element. The distance measurer measures the distance byreceiving second light resulting from reflection of the illuminationlight emitted from the light source of the spectroscope by themeasurement target.

In the application example, the light source is a common light sourceused in the spectrometry process performed by the spectroscope and usedin the distance measurement performed by the distance measurer.Accordingly, one part of the illumination light emitted to themeasurement target from the light source is incident on the spectrometryelement of the spectroscope and is used in the spectrometry process, andthe other part is incident on the distance measurer and is used in thedistance measurement. Therefore, light from a single light source can beutilized in the distance measurement and the spectrometry, and thedevice is simplified and reduced in size.

In addition, since the light from a single light source that is incidenton a predetermined position of measurement in the measurement target isincident on the spectroscope and the distance measurer, the distancemeasurer can detect the distance between the spectroscope and theposition of measurement at which the spectrometry is performed. That is,in a case of measuring the distance between the position separated fromthe position of measurement and the spectroscope, the distance to thespectroscope may be different from the position of measurement at whichthe spectrometry is performed and from the position at which thedistance measurement is performed because of, for example, a ripple onthe measurement target (e.g., paper) or distortion of a transport path.Regarding this matter, in the application example, the measured value iscorrected by measuring the distance between the position of measurement,at which the spectrometry is performed by the spectroscope, and thespectroscope with the distance measurer. Thus, the measured value can beappropriately corrected based on the accurate distance between theposition of measurement and the spectroscope, and colorimetry accuracycan be improved.

In addition, for example, in a case where a spectrometry light sourceand a distance measuring light source are used to irradiate the positionof measurement with light from each light source, light is incident atthe position of measurement at a different angle from each of thedifferent light sources. Generally, in a case of performing acolorimetry process, the angle of incidence of the illumination light atthe position of measurement and the angle of reflection of reflectedlight received by a light receiver are preferably set based ongeometrical conditions defined by a color measurement standard (JIS Z8722). However, as described above, if a distance measuring light sourceis separately disposed, it is difficult to cause light from the distancemeasuring light source to be incident at the angle based on the colormeasurement standard. It is also considered that the distance measuringlight source is turned off during the spectrometry. However, in thiscase, the distance between the measurement target and the spectroscopecannot be measured at the time of performing the spectrometry.Particularly, if the spectrometry is performed by mounting thespectroscope and the distance measurer on one carriage and causing thecarriage to scan in a predetermined direction (moving the position ofmeasurement), the position at which the distance measurement isperformed is different from the position at which the spectrometry isperformed, and correction accuracy is decreased when the measured valueis corrected according to the distance.

Regarding this matter, in the application example, both of thespectrometry and the distance measurement are performed by using asingle light source. Thus, the spectrometry process can be performedunder appropriate geometrical conditions complying with the colormeasurement standard. In addition, the distance measurer can accuratelymeasure the distance between the spectroscope and the position ofmeasurement at which the spectrometry is performed. Therefore,correction accuracy can be improved when the measured value is correctedaccording to the distance, and the accuracy in the colorimetry processis also improved.

In the spectrometry device of the application example, the spectrometryunit corrects the measured value based on the distance that is measuredby the distance measurer at a time at which the measured value from thespectrometry is obtained.

In the application example, the spectrometry unit corrects the measuredvalue based on the distance measured at the time of obtaining themeasured value. In this case, for example, even if the position ofmeasurement is moved by mounting the spectroscope and the distancemeasurer on a carriage and causing the carriage to scan in apredetermined direction, measurement error is reduced. In addition,since there is no need to stop the carriage at the position ofmeasurement, high speed spectrometry can be performed.

In the spectrometry device of the application example, the spectrometryunit obtains distance-intensity data in which the amount of change inlight intensity is recorded with respect to the distance between themeasurement target and the spectroscope, and corrects the measured valuebased on the distance-intensity data.

As described above, if the distance between the measurement target andthe spectroscope is changed, the intensity of light that is incident onthe spectroscope is also changed and decreased according to the amountof distance change. In the application example, the distance-intensitydata in which the amount of change in light intensity is recorded withrespect to the distance is obtained at the time of correcting themeasured value. Thus, the amount of change in light intensity can beeasily obtained with respect to the measured distance, and the measuredvalue can be easily corrected based on the amount of change in lightintensity.

In the spectrometry device of the application example, the spectrometryunit obtains the distance-intensity data that corresponds to each of aplurality of wavelengths and corrects the measured value based on thedistance-intensity data that corresponds to a wavelength in whichspectroscopy is performed by the spectroscopy element.

In the application example, the spectrometry unit corrects the measuredvalue based on the distance-intensity data corresponding to the measuredvalue in each wavelength. Accordingly, each measured value in eachwavelength can be corrected to an appropriate value corresponding to themeasured distance.

In the spectrometry device of the application example, the spectroscopyelement is a wavelength-selective Fabry-Pérot etalon element.

In the application example, a wavelength-selective Fabry-Pérot etalonelement is used as the spectroscopy element. Such an etalon element hasa low cost and small size in comparison with a case where otherspectroscopy elements such as an acousto-optic tunable filter (AOTF) anda liquid crystal tunable filter (LCTF) are used. Thus, the cost and sizeof the spectrometry device are decreased. In addition, since thespectral wavelength can be changed, spectrometry can be easily performedby a simple configuration on, for example, light of a plurality ofwavelengths in a predetermined measurement target wavelength region.

According to another application example of the present disclosure,there is provided an image forming apparatus including the spectrometrydevice and an image forming unit that forms an image on an imageformation target.

In the application example, a reference color image such as a colorpatch is formed by the image forming unit on the image formation target,and then, high accuracy spectrometry can be performed by thespectrometry device on the reference color image formed. Thus, it ispossible to determine with high accuracy whether the color of thereference color image formed is the same as the color that the imageforming unit is commanded to form, and, if the colors are different,feedback can be provided to the image forming unit according to aspectrometry result.

According to still another application example of the presentdisclosure, there is provided a spectrometry method for a spectrometrydevice including a spectroscope that includes a spectroscopy element onwhich light from a measurement target is incident and a distancemeasurer that measures the distance between the measurement target andthe spectroscope. The method includes performing a spectrometry processon the light using the spectroscope to obtain a measured value;measuring a distance between the measurement target and the spectroscopewith the distance measurer; and correcting the measured value based onthe distance.

In the application example, as in the above application examples, themeasured value at a position measured by performing the spectrometry iscorrected based on the distance between the measurement target and thespectroscope measured by the distance measuring. Accordingly, even ifthe distance between the measurement target and the spectroscope ischanged, a high accuracy colorimetry process can be performed bycorrecting the measured value according to the distance.

BRIEF DESCRIPTION OF THE DRAWINGS

The present disclosure will be described with reference to theaccompanying drawings, wherein like numbers reference like elements.

FIG. 1 is a perspective view illustrating an exterior configuration of aprinter of a first embodiment according to the present disclosure.

FIG. 2 is a block diagram illustrating a schematic configuration of theprinter of the present embodiment.

FIG. 3 is a schematic diagram illustrating a configuration of aspectroscope and a distance sensor of the present embodiment.

FIG. 4 is a sectional view illustrating a spectroscopy device thatincludes a wavelength-selective interference filter (spectroscopyelement) of the present embodiment.

FIGS. 5A to 5C are diagrams illustrating a position of measurement ofdistance performed by the distance sensor and a position of measurementperformed by the spectroscope of the present embodiment.

FIGS. 6A to 6C are diagrams illustrating a position of measurement ofdistance performed by a distance sensor and a position of measurementperformed by a spectroscope of a comparative example.

FIG. 7 is a block diagram illustrating each functional configuration ofa control unit of the printer in the first embodiment.

FIG. 8 is a flowchart illustrating a spectrometry method for the printerof the first embodiment.

FIGS. 9A and 9B are diagrams illustrating a relationship between aposition of illumination light irradiation and the position ofmeasurement in the first embodiment.

FIG. 10 is a diagram illustrating an example of distance-intensity datain the first embodiment.

DESCRIPTION OF EXEMPLARY EMBODIMENTS

Hereinafter, one embodiment according to the present disclosure will bedescribed based on the drawings. In the present embodiment, hereinafter,a printer 10 (ink jet printer) that includes a spectrometry device willbe described as an example of an image forming apparatus of the presentdisclosure.

Schematic Configuration of Printer

FIG. 1 is a diagram illustrating an exterior configuration example ofthe printer 10 of the present embodiment. FIG. 2 is a block diagramillustrating a schematic configuration of the printer 10 of the presentembodiment.

As illustrated in FIG. 1, the printer 10 includes a supply unit 11, atransport unit 12, a carriage 13, a carriage moving unit 14, and acontrol unit 15 (refer to FIG. 2). The printer 10 controls each of theunits 11, 12, 14, and the carriage 13 based on print data that is inputfrom an external apparatus 20 such as a personal computer and prints animage on a medium A. The medium A constitutes a measurement target andan image formation target of the present disclosure. In addition, theprinter 10 of the present embodiment forms a measurement color patch ata predetermined position on the medium A based on preset calibrationprint data and performs spectrometry on the color patch. Accordingly,the printer 10 determines whether a color shift is present in theprinted color by comparing an actual measured value from the color patchwith the calibration print data and, if a color shift is present,corrects color based on the actual measured value.

Hereinafter, each configuration of the printer 10 will be specificallydescribed.

The supply unit 11 is a unit that supplies the image formation targetmedium A (e.g., paper) to the position of image formation. The supplyunit 11, for example, includes a roll body 111 (refer to FIG. 1) onwhich the medium A is wound, a roll drive motor (not illustrated), and aroll drive wheel array (not illustrated). The roll drive motor isrotationally driven based on a command from the control unit 15, and thetorque of the roll drive motor is transmitted to the roll body 111through the roll drive wheel array. Accordingly, the roll body 111rotates and supplies the paper wound on the roll body 111 to thedownstream side (+Y direction) in a Y direction (sub-scanningdirection).

While the present embodiment illustrates supply of paper that is woundon the roll body 111, this illustration is not for limitation purposes.The medium A may be supplied in any method, such as supplying paperstacked in a tray one sheet at a time by a roller or the like.

The transport unit 12 transports the medium A supplied from the supplyunit 11 along the Y direction. The transport unit 12 is configured toinclude a transport roller 121, a driven roller (not illustrated) thatis arranged to interpose the medium A between the transport roller 121and the driven roller and driven by the transport roller 121, and aplaten 122.

Drive force is transmitted to the transport roller 121 from a transportmotor (not illustrated). When the transport motor is driven by controlof the control unit 15, the transport roller 121 is rotationally drivenby the torque of the transport motor and transports, along the Ydirection, the medium A that is interposed between the transport roller121 and the driven roller. The platen 122 that faces the carriage 13 isdisposed on the downstream side (+Y side) of the transport roller 121 inthe Y direction.

The carriage 13 includes a printing unit 16 that prints an image on themedium A, a spectroscope 17 that performs spectrometry at apredetermined position of measurement (in a range of measurement) on themedium A, and a distance sensor 18 that measures the distance betweenthe medium A and the spectroscope 17.

The carriage 13 is disposed to be movable by the carriage moving unit 14along a main-scanning direction (X direction) that intersects with the Ydirection.

The carriage 13 is connected to the control unit 15 by a flexiblecircuit 131 and performs a printing process (process of forming an imageon the medium A) with the printing unit 16 and a light intensitymeasuring process with the spectroscope 17 based on a command from thecontrol unit 15.

A detailed configuration of the carriage 13 will be described later.

The carriage moving unit 14 constitutes a moving unit of the presentdisclosure and causes the carriage 13 to reciprocate along the Xdirection based on a command from the control unit 15.

The carriage moving unit 14, for example, is configured to include acarriage guide shaft 141, a carriage motor 142, and a timing belt 143.

The carriage guide shaft 141 is arranged along the X direction and hasboth end portions fixed to, for example, the casing of the printer 10.The carriage motor 142 drives the timing belt 143. The timing belt 143is approximately parallel to the carriage guide shaft 141, and a part ofthe carriage 13 is fixed thereto. When the carriage motor 142 is drivenbased on a command of the control unit 15, the timing belt 143 travelsin normal (i.e., forward) and reverse directions, and the carriage 13fixed to the timing belt 143 reciprocates while being guided by thecarriage guide shaft 141.

Next, a configuration of the printing unit 16, the spectroscope 17, andthe distance sensor 18 disposed in the carriage 13 will be described.

Configuration of Printing Unit (Image Forming Unit)

The printing unit 16 is an image forming unit of the present disclosureand forms an image on the medium A by discharging ink separately ontothe medium A from the part facing the medium A.

Ink cartridges 161 that correspond to ink of a plurality of colors aremounted on the printing unit 16 in an attachable and detachable manner,and ink is supplied from each ink cartridge 161 to an ink tank (notillustrated) through a tube (not illustrated). In addition, nozzles (notillustrated) that discharge ink drops are disposed on the lower face ofthe printing unit 16 (i.e., a position facing the medium A) incorrespondence with each color. A piezoelectric element, for example, isarranged in each of these nozzles. Driving the piezoelectric elementcauses an ink drop supplied from the ink tank to be discharged and hitthe medium A, and a dot is formed.

Configuration of Spectroscope

FIG. 3 is a schematic diagram illustrating a configuration of thespectroscope 17.

The spectroscope 17 includes an illumination optical system 171 and alight receiving optical system 172 as illustrated in FIG. 3.

The spectroscope 17 irradiates the medium A with light (i.e.,illumination light) from the illumination optical system 171 andreceives reflective light reflected by the medium A with the lightreceiving optical system 172. A spectroscopy device 172A that isdisposed in the light receiving optical system 172 can select awavelength to be transmitted based on control of the control unit 15 andcan perform spectrometry at a position of measurement R on the medium Aby measuring the intensity of light of each wavelength in visible light.

In the present embodiment, spectrometry is performed in accordance withgeometrical optics condition (0°: 45°x) defined by the color measurementstandard (JIS Z 8722). In the present embodiment, light from theillumination optical system 171 is incident on the medium A in thedirection of the normal line toward the medium A or may also be incidentat an angle of 10° or less. Light reflected by the medium A at 45°±2° isreceived by the light receiving optical system 172.

While the present embodiment illustrates the illumination optical system171 and the light receiving optical system 172 as being linearlyconfigured along the X direction for convenience of description, thisillustration is not for limitation purposes. The illumination opticalsystem 171 and the light receiving optical system 172 may be linearlyconfigured along the Y direction, or the illumination optical system 171and the light receiving optical system 172 may be linearly configuredalong the direction intersecting with the X and Y directions.

Configuration of Illumination Optical System

The illumination optical system 171 includes a light source 171A and anillumination-side aperture 171B as illustrated in FIG. 3. A collimatinglens, for example, that turns light from the light source 171A intoparallel light may be separately disposed.

In the illumination optical system 171, the medium A is irradiated withlight, of the light emitted from the light source 171A, that passesthrough the illumination-side aperture 171B. Such illumination light hasa high intensity (high luminance) in the central portion (near theprincipal ray) thereof and has a low intensity in the peripheral portionthereof. The illumination light turns into a spotlight by passingthrough the illumination-side aperture 171B.

Configuration of Light Receiving Optical System

The light receiving optical system 172 includes the spectroscopy device172A, a light receiver 172B, a light-reception-side aperture 172C, and areflecting mirror 172D as illustrated in FIG. 3.

In the light receiving optical system 172, light that is reflected bythe medium A is reflected by the reflecting mirror 172D toward thespectroscopy device 172A, and the light receiver 172B receives light ofa predetermined wavelength on which spectroscopy is performed by thespectroscopy device 172A. The light receiving optical system 172 may beconfigured as a bandpass filter that cuts light other than visiblelight.

The light-reception-side aperture 172C may be disposed in pluralquantities. The position at which the light-reception-side apertures172C are disposed may be at the front of the light receiver 172B or, forexample, may be incorporated into the spectroscopy device 172A. Whilethe present embodiment illustrates a configuration in which reflectivelight is reflected by the reflecting mirror 172D toward the lightreceiver 172B, light that is incident on the light receiving opticalsystem 172 may be directly incident on the spectroscopy device 172Awithout disposing the reflecting mirror 172D.

Configuration of Spectroscopy Device

FIG. 4 is a sectional view illustrating a schematic configuration of thespectroscopy device 172A.

The spectroscopy device 172A includes a casing 6 and awavelength-selective interference filter 5 (i.e., spectroscopy element)that is accommodated in the casing 6.

Configuration of Wavelength-Selective Interference Filter

The wavelength-selective interference filter 5 is a wavelength-selectiveFabry-Pérot etalon element and constitutes a spectroscopy element of thepresent disclosure. While the present embodiment illustrates thewavelength-selective interference filter 5 as being arranged in thespectroscope 17 while being accommodated in the casing 6, thewavelength-selective interference filter 5, for example, may beconfigured to be directly arranged in the spectroscope 17.

The wavelength-selective interference filter 5 includes alight-transmissive fixed substrate 51 and a light-transmissive movablesubstrate 52 as illustrated in FIG. 4. The fixed substrate 51 and themovable substrate 52 are integrally configured by bonding with a bondingfilm 53. The fixed substrate 51 includes a first groove portion 511formed by etching and a second groove portion 512 having a smaller depththan the first groove portion 511. A fixed electrode 561 and a fixedreflecting film 54 are respectively disposed in the first groove portion511 and in the second groove portion 512. The fixed reflecting film 54is configured of, for example, a metal film made of Ag, an alloy filmmade of an Ag alloy, a dielectric multilayer film made of a laminate ofa high-refractive layer and a low-refractive layer, or a laminated bodymade of a laminate of a metal film (alloy film) and a dielectricmultilayer film.

The movable substrate 52 includes a movable portion 521 and a holdingportion 522 that is disposed outside of the movable portion 521 to holdthe movable portion 521. A face of the movable portion 521 that facesthe fixed substrate 51 includes a movable electrode 562 which faces thefixed electrode 561 and a movable reflecting film 55 which faces thefixed reflecting film 54. As the movable reflecting film 55, areflecting film having the same configuration as the fixed reflectingfilm 54 can be used. The holding portion 522 is a diaphragm thatsurrounds the movable portion 521 and is formed to have a smallerthickness dimension than the movable portion 521.

The fixed electrode 561 and the movable electrode 562 constitute anelectrostatic actuator 56 in the wavelength-selective interferencefilter 5. Applying a voltage to the electrostatic actuator 56 can changethe dimension of a gap G between the fixed reflecting film 54 and themovable reflecting film 55. In a peripheral portion of the movablesubstrate 52 that does not face the fixed substrate 51, the movablesubstrate 52 includes a plurality of electrode pads 57 that isindividually connected to the fixed electrode 561 and to the movableelectrode 562.

Configuration of Casing

The casing 6 includes a base 61 and a glass substrate 62 as illustratedin FIG. 4. The base 61 and the glass substrate 62 are bonded by, forexample, low melting point glass bonding and form an accommodative spacetherein. The wavelength-selective interference filter 5 is accommodatedin the accommodative space.

The base 61 is configured of, for example, a laminate of thin ceramicplates and includes a recessed portion 611 that can accommodate thewavelength-selective interference filter 5. The wavelength-selectiveinterference filter 5 is fixed to, for example, a side face of therecessed portion 611 of the base 61 by a fixing material 64. A lightpass hole 612 is disposed on the bottom face of the recessed portion 611of the base 61, and a cover glass 63 is bonded to the bottom face coverthe light pass hole 612.

An inside terminal unit 613 is disposed in the base 61 and is connectedto the electrode pad 57 of the wavelength-selective interference filter5. The inside terminal unit 613 is connected through a conductive hole614 to an outside terminal unit 615 that is disposed outside of the base61. The outside terminal unit 615 is electrically connected to thecontrol unit 15.

Configuration of Light Receiver

Returning to FIG. 3, the light receiver 172B is arranged on the opticalaxis of the wavelength-selective interference filter 5 (straight linepassing through the central points of the reflecting films 54 and 55).The light receiver 172B receives, in a light receiving region, lightthat is transmitted through the wavelength-selective interference filter5, and outputs a detection signal (current value) that corresponds tothe intensity of light received. The detection signal output by thelight receiver 172B is input into the control unit 15 through an I-Vconverter (not illustrated), an amplifier (not illustrated), and an ADconverter (not illustrated).

Configuration of Distance Sensor

The distance sensor 18 is a distance measurer of the present disclosureand is disposed in the carriage 13 along with the printing unit 16 andthe spectroscope 17.

As illustrated in FIG. 3, the distance sensor 18 includes a lightreceiving lens 181 and a position sensing device (PSD) 182. Light thatis incident from the position of measurement R is received by the PSD182 through the light receiving lens 181.

While the present embodiment uses a PSD type distance sensor thatdetects the central position in the received light and calculates thedistance between the medium A and the spectroscope 17 by triangulationbased on the central position, this is not for limitation purposes. Forexample, a distance sensor 18 of a CMOS type that uses a complementarymetal oxide semiconductor (CMOS) may be used. In addition, the distancesensor 18 is not limited to a sensor that calculates distance bytriangulation using light from the light source 171A. A distance sensorusing other distance measuring methods may also be used. For example, adistance sensor that divides laser light into reference light andmeasured light and calculates distance based on an interference fringeof multiplexed light in which measured light reflected by the medium Aand the reference light are multiplexed may also be used.

FIGS. 5A to 5C are diagrams illustrating a position of measurement ofdistance performed by the distance sensor 18 and a position ofmeasurement performed by the spectroscope in the present embodiment.FIGS. 6A to 6C are diagrams illustrating a position of measurement ofdistance performed by a distance sensor and a position of measurementperformed by a spectroscope in a comparative example.

As illustrated in FIG. 6A, a distance sensor 19 and a light sensor 191are located separately from the spectroscope 17, which includes thelight source 171A and the light receiver 172B. The distance sensor 19 ispositioned to measure the distance between the medium A and thespectroscope 17 at a position other than the position of measurement R.In this case, the position of measurement R at which spectrometry isperformed is different from a position of measurement P at which thedistance is measured by the distance sensor 19. Therefore, asillustrated in FIG. 6B, if the distance between the medium A and thespectroscope 17 is partially different because of a ripple or the likeoccurring on the medium A, the distance between the position ofmeasurement R and the spectroscope 17 cannot be measured. In the exampleof FIG. 6B, the distance measured by the distance sensor 19 is shorterthan the original measured distance between the position of measurementR and the spectroscope 17.

In addition, as illustrated in FIG. 6C, if the carriage 13 is slantedby, for example, vibration during movement of the carriage 13, thedistance between the position of measurement R and the spectroscope 17cannot be measured. In the example illustrated in FIG. 6C, the distancemeasured by the distance sensor 19 is longer than the original measureddistance between the position of measurement R and the spectroscope 17.

The distance sensor 18 of the present embodiment is incorporated intothe spectroscope 17 as illustrated in FIG. 3 and FIGS. 5A to 5C, and thedistance between the position of measurement R and the spectroscope 17is detected by irradiating the position of measurement R with light fromthe light source 171A and receiving reflective light reflected at theposition of measurement R. That is, in the present embodiment, theillumination light of the light source 171A is used in both spectrometryand distance measurement. In this case, even if a ripple, for example,occurs on the medium A as illustrated in FIG. 5B, the distance betweenthe medium A and the spectroscope 17 is measured at the position ofmeasurement R where spectrometry is performed by the spectroscope 17. Inaddition, even if the carriage 13 is slanted during movement or the likeof the carriage 13 as illustrated in FIG. 5C, the distance between themedium A and the spectroscope 17 is measured at the position ofmeasurement R where spectrometry is performed.

Configuration of Control Unit

With reference to FIG. 2, the control unit 15 is configured to includean I/F 151, a unit controller circuit 152, a memory 153, and a centralprocessing unit (CPU) 154.

The I/F 151 inputs to the CPU 154 the print data that is provided fromthe external apparatus 20.

The unit controller circuit 152 includes a controller circuit thatcontrols each of the supply unit 11, the transport unit 12, the printingunit 16, the light source 171A, the wavelength-selective interferencefilter 5, the light receiver 172B, and the carriage moving unit 14 andcontrols operation of each unit based on a command signal from the CPU154. It is also possible that a controller circuit of each unit isdisposed separately from the control unit 15 and is connected to thecontrol unit 15.

The memory 153 stores various programs and various data that controloperation of the printer 10.

For example, the memory 153 may store: V-λ data that represents thewavelength of light transmitted through the wavelength-selectiveinterference filter 5 with respect to the voltage applied to theelectrostatic actuator 56 when the wavelength-selective interferencefilter 5 is controlled; and printing profile data that stores the amountof each ink to be discharged with respect to color data which isincluded as the print data. In addition, the memory 153 may store lightemitting characteristics of the light source 171A with respect to eachwavelength, light receiving characteristics (light reception sensitivitycharacteristics) of the light receiver 172B with respect to eachwavelength, and the like.

Furthermore, the memory 153 stores distance-intensity data. Thedistance-intensity data is data that indicates a relationship of a lightintensity at the position of measurement R with respect to the distancebetween the medium A and the spectroscope 17.

FIG. 7 is a block diagram illustrating a functional configuration of theCPU 154 included in the control unit 15 of the printer 10.

The CPU 154 functions as a scanning controller 154A, a printingcontroller 154B, a measuring controller 154C, a color measurer 154D, anda calibrator 154E as illustrated in FIG. 7 by reading and executingvarious programs stored in the memory 153.

The scanning controller 154A outputs to the unit controller circuit 152a command signal that indicates driving of the supply unit 11, thetransport unit 12, and the carriage moving unit 14. Accordingly, theunit controller circuit 152 drives the roll drive motor of the supplyunit 11 and supplies the medium A to the transport unit 12. The unitcontroller circuit 152 drives the transport motor of the transport unit12 to transport a predetermined region of the medium A along the Ydirection to a position on the platen 122 facing the carriage 13. Theunit controller circuit 152 drives the carriage motor 142 of thecarriage moving unit 14 to move the carriage 13 along the X direction.

The printing controller 154B outputs a command signal that indicatescontrol of the printing unit 16 to the unit controller circuit 152 basedon, for example, the print data that is input from the externalapparatus 20. When the command signal is output to the unit controllercircuit 152 from the printing controller 154B, the unit controllercircuit 152 outputs a printing control signal to the printing unit 16 todrive the piezoelectric element disposed in the nozzle and causes ink tobe discharged to the medium A. When printing is performed, an imageconfigured of a plurality of dots is printed on the medium A byalternately repeating a dot forming operation that moves the carriage 13along the X direction and discharges ink from the printing unit 16, asthe carriage 13 is moving, to form a dot and a transport operation thattransports the medium A in the Y direction.

The measuring controller 154C constitutes a spectrometry unit of thepresent disclosure along with the color measurer 154D and performs aspectrometry process. Specifically, the measuring controller 154Coutputs a command signal for controlling the light source 171A to theunit controller circuit 152 and causes light to be emitted from thelight source 171A.

The measuring controller 154C reads a drive voltage for theelectrostatic actuator 56 with respect to the wavelength of lighttransmitted through the wavelength-selective interference filter 5 fromthe V-λ data of the memory 153 and outputs a command signal to the unitcontroller circuit 152. Accordingly, the unit controller circuit 152applies the drive voltage from the command signal to thewavelength-selective interference filter 5, and light of a desiredtransmitted wavelength is transmitted through the wavelength-selectiveinterference filter 5.

The measuring controller 154C stores the detection signal in associationwith the voltage applied to the electrostatic actuator 56 (or thewavelength of light transmitted through the wavelength-selectiveinterference filter 5 that corresponds to the voltage) in the memory153.

The color measurer 154D constitutes the spectrometry unit of the presentdisclosure along with the measuring controller 154C. The color measurer154D corrects the intensity of received light of a plurality ofwavelengths obtained by the spectrometry process based on the distancemeasured by the distance sensor 18, and measures the intensity of colorat the position of measurement R based on the corrected intensity ofreceived light.

The calibrator 154E corrects (updates) the printing profile data basedon a color measurement result from the color measurer 154D.

Operation of each functional configuration in the control unit 15 willbe described in detail later.

Spectroscopy Method

Next, a spectroscopy method performed by the printer 10 of the presentembodiment will be described based on the drawings.

FIG. 8 is a flowchart illustrating the spectroscopy method in theprinter 10.

As a spectrometry process performed by the printer 10, an example inwhich the spectrometry process is performed on a plurality of colorpatches printed by the printing unit 16 will be described.

In the spectrometry process of the present example, a command thatindicates performing of the spectrometry process is received from, forexample, user operation or input from the external apparatus 20 (StepS1). When the command is received in Step S1, the scanning controller154A controls the transport unit 12 and the carriage moving unit 14 totransport the medium A along the Y direction so that the carriage 13 ispositioned on a line in which the color patches are arranged and,furthermore, to move the carriage 13 to the position of calibration (forexample, to the −X side end portion) (Step S2).

The position of calibration is a position for performing a calibrationdata obtaining process, described later, and is a white region in themedium A (e.g., white paper) where no color patch is disposed. Thecalibration reference object is not limited to the white region. Forexample, a calibration reference object that has a known reflectance ineach wavelength may be separately installed. For example, a whitereference object having a known reflectance may be disposed at a part ofthe platen 122, and the white reference object may be used as thecalibration reference object of the present disclosure.

The control unit 15 performs the calibration data obtaining process thatobtains calibration data to correct a spectrometry result. In thecalibration data obtaining process, the measuring controller 154Cperforms the spectrometry process at the position of calibration andmeasures the intensity of light (i.e., an output value from the lightreceiver 172B), as a measured value. The intensity of light may bemeasured for, for example, n measured wavelength bands (e.g., 16 bands)in the visible light region from 400 nm to 700 nm at an interval of 20nm.

Specifically, the measuring controller 154C first turns on the lightsource 171A (Step S3).

The measuring controller 154C applies the drive voltage to theelectrostatic actuator 56 of the wavelength-selective interferencefilter 5 based on the V-λ data stored in the memory 153. Accordingly,light, of the reflective light that is reflected from the position ofmeasurement R to the spectroscope 17, having a measured wavelengthcorresponding to the dimension of the gap between the reflecting films54 and 55 of the wavelength-selective interference filter 5 istransmitted and is received by the light receiver 172B, and theintensity of light received in the measured wavelength is measured (StepS4: spectrometry step).

The measuring controller 154C obtains the distance between the medium Aand the spectroscope 17 measured by the distance sensor 18 insynchronization with Step S4 (Step S5: distance measuring step).

The measuring controller 154C stores the intensity of received lightmeasured in Step S4 (reference light intensity) and the distanceobtained in Step S5 in association with the measured wavelength (or thevoltage applied to the electrostatic actuator 56) in the memory 153.

The measuring controller 154C determines whether there is an unmeasuredwavelength (Step S6). That is, the measuring controller 154C determineswhether the reference light intensity is measured in 16 measuredwavelength bands from 400 nm to 700 nm at an interval of 20 nm. If StepS6 is determined as “Yes” (if there is an unmeasured wavelength), theprocess returns to Step S4, and measurement of the reference lightintensity continues in the unmeasured wavelength.

If Step S6 is determined as “No”, the scanning controller 154A controlsthe transport unit 12 and the carriage moving unit 14 to move thecarriage 13 so that the position of measurement R is positioned on thecolor patches (Step S7).

The measuring controller 154C performs the spectrometry process on thecolor patches by performing the same process as in Step S4. That is, themeasuring controller 154C applies the drive voltage to the electrostaticactuator 56 of the wavelength-selective interference filter 5 based onthe V-λ data stored in the memory 153 and measures the intensity ofreceived light based on a light reception signal from the light receiver172B (Step S8: spectrometry step).

The measuring controller 154C obtains the distance between the medium Aand the spectroscope 17 measured by the distance sensor 18 insynchronization with the timing of obtaining the intensity of receivedlight in Step S8 (Step S9: distance measuring step).

The measuring controller 154C stores the intensity of received lightmeasured in Step S8 (measured light intensity) and the distance obtainedin Step S9 in association with the measured wavelength (or the voltageapplied to the electrostatic actuator 56) in the memory 153.

The measuring controller 154C determines whether there is an unmeasuredwavelength (Step S10) as in Step S6, and the process returns to Step S8if Step S10 is determined as “Yes”.

If Step S10 is determined as “No”, the measuring controller 154C furtherdetermines whether there is an unmeasured color patch (Step S11).

If Step S11 is determined as “Yes”, the process returns to Step S7, andthe scanning controller 154A controls the transport unit 12 and thecarriage moving unit 14 to move the position of measurement R in thespectroscope 17 to a subsequent color patch and continues thespectrometry process on the subsequent color patch.

If Step S11 is determined as “No”, the measuring controller 154C turnsoff the light source 171A (Step S12).

The color measurer 154D corrects the reference light intensity measuredin Step S4 and the measured light intensity measured in Step S8 based onthe distance-intensity data stored in the memory 153 (Step S13:correcting step).

Hereinafter, light intensity correction performed by the color measurer154D will be described.

FIGS. 9A and 9B are diagrams illustrating a relationship between theposition of illumination light irradiation and the position ofmeasurement in the present embodiment. FIG. 9A illustrates arelationship between the position of irradiation irradiated with theillumination light and the position of measurement R at which theillumination light is received by the light receiver 172B of thespectroscope 17 when the position of the medium A is displaced in the Zdirection. In other words, FIG. 9A illustrates a range of irradiation ofthe illumination light and the position of measurement R at which theillumination light is reflected and received by the light receiver 172Bwhen the distance between the medium A and the spectroscope 17 changes.FIG. 9B is a diagram illustrating a light distribution at the positionof measurement R when the position of the medium A is displaced in the Zdirection.

As illustrated in FIGS. 9A and 9B, if the distance between the medium Aand the spectroscope 17 is equal to a reference distance without aripple or the like on the medium A (i.e., a reference position A₀), theposition of measurement R, which is indicated by R₀ in FIGS. 9A and 9B,is the central portion of the spotlight. In other words, the position ofmeasurement R₀, from which light is received by the light receiver 172Bof the spectroscope 17, aligns with the central position of thespotlight irradiated by the illumination light when the medium A doesnot have any ripples. In this case, as illustrated by a lightdistribution in FIG. 9B, a large area of a high illuminance region isincluded in a position of measurement R₀, and the intensity of lightreceived in the light receiver 172B is also increased.

As illustrated in FIGS. 9A and 9B, when the medium A is positioned at aposition A₁, the distance between the medium A and the spectroscope 17is increased by Δh and the position of measurement R is moved to the −Xside (i.e., position R₁). In this case, a high illuminance region ispresent on the +X side of the position of measurement R₁ while a lowilluminance region is present on the −X side thereof. Therefore, theintensity of received light is further decreased in a case wherereflected light from the position of measurement R₁ is received by thelight receiver 172B than in a case where reflected light from theposition of measurement R₀ is received.

Similarly, when the medium A is positioned at a position A₂, thedistance between the medium A and the spectroscope 17 is decreased by Δhand the position of measurement R is moved to the +X side (i.e.,position R₂) as illustrated in FIGS. 9A and 9B. Therefore, the intensityof received light reflected is further decreased from the position ofmeasurement R₂ than from the position of measurement R₀.

In the present embodiment, the distance-intensity data that indicates achange in the intensity of light received by the light receiver 172Bwith respect to the distance between the medium A and the spectroscope17 is stored in the memory 153 as described above.

FIG. 10 is a diagram illustrating an example of the distance-intensitydata of the present embodiment.

Specifically, as illustrated in FIG. 10, the ratio of change in theintensity of light received by the light receiver 172B (i.e., acorrection coefficient) to an amount of distance change Δh between themedium A and the spectroscope 17 (i.e., amount of change of the medium Ain the Z direction from the reference position A₀) is recorded in thedistance-intensity data. The distance-intensity data is set for eachmeasured wavelength. For example, since spectrometry is performed in 16measured wavelength bands in the visible light region (400 nm to 700 nm)in the present embodiment, the distance-intensity data is stored in thememory 153 for each of the 16 measured wavelength bands.

While FIG. 10 illustrates the distance-intensity data in which thecorrection coefficient is recorded with respect to the amount ofdistance change, the correction coefficient may be recorded with respectto the distance between the medium A and the spectroscope 17.

In Step S13, the color measurer 154D obtains the correction coefficient(ratio of change in light intensity) corresponding to the distanceobtained in Step S5 from the distance-intensity data, and calculates acorrected reference light intensity by dividing the reference lightintensity measured in Step S4 by the correction coefficient. Similarly,the color measurer 154D obtains the correction coefficient correspondingto the distance obtained in Step S8 from the distance-intensity data andcalculates a corrected measured light intensity by dividing the measuredlight intensity measured in Step S9 by the correction coefficient.

The color measurer 154D calculates a reflectance R₂ fromR_(λ)=E_(λ)/E_(λ0) based on the corrected reference light intensity(E_(λ0)) and the corrected measured light intensity (E_(λ)) in eachmeasured wavelength (Step S14).

In addition, the color measurer 154D calculates the intensity of color(for example, an XYZ value or an L*a*b* value) from the reflectanceR_(λ) in each measured wavelength and stores the intensity of color inthe memory 153.

The color measurer 154D may output a calculated spectral reflectance orthe intensity of color to, for example, the external apparatus 20 or toa display disposed with the printer 10 or may control the printing unit16 to print the color measurement result.

The calibrator 154E updates the printing profile data stored in thememory 153 based on the color measurement result for each color patch.

Effect of Present Embodiment

In the printer 10 of the present embodiment, the spectroscope 17 and thedistance sensor 18 are mounted on the carriage 13. In addition, thecolor measurer 154D corrects the intensity of light received in eachwavelength obtained from spectrometry using the spectroscope 17 by usingthe distance between the medium A and the spectroscope 17 measured bythe distance sensor 18. Accordingly, even if the distance between theposition of measurement and the spectroscope is changed, the intensityof received light can be corrected according to the distance. Thus, ahigh accuracy colorimetry process can be performed on the measurementtarget color patch based on the intensity of received light.

In the present embodiment, the distance sensor 18 measures the distancebetween the medium A and the spectroscope 17 by using the illuminationlight from the light source 171A of the spectroscope 17. Thus, distancecan be accurately measured at the position of measurement R.

That is, if the position of measurement R for spectrometry is differentfrom the position of distance measurement performed by the distancesensor 18, the distance between the medium A and the spectroscope 17 maybe different at the position of measurement R and at the position ofdistance measurement because of a ripple occurring at a part of themedium A. In such a case, distance cannot be accurately measured at theposition of measurement R, and thus, the intensity of received lightcannot be appropriately corrected. Regarding this matter, distance ismeasured by the distance sensor 18 at the position of measurement R inthe present embodiment. Thus, the intensity of received light can beaccurately corrected based on the distance.

In addition, since there is no need to dispose a separate distancesensor light source, a configuration can be simplified and reduced insize.

In the present embodiment, distance is measured by the distance sensor18 at the timing of performing spectrometry (i.e., at the time ofmeasuring the intensity of received light, which is the measured value),and the intensity of received light is corrected based on the measureddistance. That is, the spectrometry process is performed insynchronization with distance measurement performed by the distancesensor 18.

Accordingly, if the distance between the medium A and the spectroscope17 is changed according to the position of measurement R by performingspectrometry while the carriage 13 is moved at a constant speed in the Xdirection, the distance between the medium A and the spectroscope 17 canbe measured at each position of measurement R. Accordingly, the measuredvalue (intensity of received light) at the position of measurement R canbe corrected based on accurate distance, and spectrometry accuracy andcolorimetry accuracy can be improved.

In the present embodiment, the color measurer 154D obtains thecorrection coefficient with respect to the measured distance based onthe distance-intensity data in which the ratio of change in theintensity of light received by the light receiver 172B to the distancebetween the medium A and the spectroscope 17 (correction coefficient) isrecorded and corrects the intensity of received light with thecorrection coefficient. In such a configuration, the intensity ofreceived light can be easily corrected based on the presetdistance-intensity data.

The distance-intensity data is set for each measured wavelength, and thecolor measurer 154D corrects the intensity of received light based onthe distance-intensity data corresponding to the measured wavelength.

Accordingly, the intensity of received light can be accurately correctedfor each measured wavelength, and colorimetry accuracy can be furtherimproved. That is, in the present embodiment, for a measured wavelength,if an intensity of light received by the light receiver 172B isdifferent due to the change in distance between the medium A and thespectroscope 17, the measured value can be corrected by using anappropriate correction coefficient corresponding to each measuredwavelength.

The present embodiment uses a wavelength-selective interference filter(wavelength-selective Fabry-Pérot etalon element) as the spectroscopyelement. Thus, low cost and size reduction can be promoted in comparisonwith a case where other spectroscopy elements such as an AOTF and anLCTF are used, and the cost and size of the spectrometry device aredecreased.

In the present embodiment, the spectroscope 17 is mounted in the printer10 that includes the printing unit 16 forming an image on the medium Aand performs spectrometry on the medium A. The calibrator 154E updatesthe printing profile data based on the reflectance in each measuredwavelength and the intensity of color calculated from the spectrometryresult.

In such a printer 10, as described above, high accuracy spectrometry canbe performed on the color patches, and a high accuracy colorimetryprocess can be performed. Therefore, by updating the printing profiledata based on the color measurement result from the colorimetry process,the printing unit 16 can form an image in which the intensity of colordesired by a user is reproduced with high accuracy.

Other Embodiments

The present disclosure is not limited to each embodiment describedabove. Modifications, improvements, and configurations obtained by anappropriate combination of each embodiment to the extent capable ofachieving the advantage of the present disclosure are to be included inthe present disclosure.

For example, while the above embodiment illustrates the distance sensor18 as receiving light from the light source 171A reflected at theposition of measurement R after irradiation, this is not for limitationpurposes.

For example, the distance between the medium A and the spectroscope 17at the position of measurement R may be measured by disposing a separatesensor light source for distance sensor, irradiating the position ofmeasurement R with light from the sensor light source, and receivingreflected light with the distance sensor.

While, in the above embodiment, the color measurer 154D calculates thecorrected reference light intensity by dividing the reference lightintensity by the correction coefficient corresponding to distance andcalculates the corrected measured light intensity by dividing themeasured light intensity by the correction coefficient corresponding todistance to calculate the reflectance based on the corrected referencelight intensity and the corrected measured light intensity, this is notfor limitation purposes. For example, given that the correctioncoefficient with respect to the distance when the reference lightintensity is measured is k_(λ0) and that the correction coefficient withrespect to the distance when the measured light intensity is measured isk_(λ1), the color measurer 154D may calculate the reflectance R_(λ) fromR_(λ)=k₀E_(λ)/k₁E_(λ0) by using the reference light intensity E_(λ0) andthe measured light intensity E_(λ).

While, in the above embodiment, the distance-intensity data is set foreach measured wavelength and the color measurer 154D obtains thecorrection coefficient from the distance-intensity data corresponding tothe measured wavelength, this is not for limitation purposes. Forexample, the ratio of change in the total intensity of the illuminationlight emitted from the light source 171A to the distance between themedium A and the spectroscope 17 (e.g., the amount of displacement fromthe reference position A₀) may be recorded in the distance-intensitydata. In this case, one distance-intensity data may be stored in thememory 153.

While, in the above embodiment, distance is measured by the distancesensor 18 by synchronizing the timing of obtaining the measured value(intensity of received light) in each measured wavelength with thetiming of obtaining the distance measured by the distance sensor 18,that is, at each timing of obtaining the measured value in onewavelength, this is not for limitation purposes.

For example, distance may be measured by the distance sensor 18 from onecolor patch only at the timing of obtaining the measured value in theinitial one band. For the measured value in the subsequent 15 measuredwavelength bands, correction may be performed by using the initiallymeasured distance. In addition, distance measurement may be performed ateach predetermined band interval. For example, distance is measured bythe distance sensor 18 at the time of spectrometry performed in measuredwavelengths of 700 nm, 600 nm, and 500 nm. The correction coefficientcorresponding to the distance at the time of obtaining the measuredvalue in 700 nm is applied to the measured wavelength between 620 nm and700 nm. The correction coefficient corresponding to the distance at thetime of obtaining the measured value in the wavelength of 600 nm is usedfor the measured wavelength between 520 nm and 600 nm. The correctioncoefficient corresponding to the distance at the time of obtaining themeasured value in 500 nm is used for the measured wavelength between 400nm and 500 nm. Alternatively, for example, the correction coefficientcorresponding to the distance at the time of obtaining the measuredvalue in 660 nm may be applied to the measured wavelength between 620 mand 700 nm. The correction coefficient corresponding to the distance atthe time of obtaining the measured value in the wavelength of 560 nm maybe used for the measured wavelength between 520 nm and 600 nm. Thecorrection coefficient corresponding to the distance at the time ofobtaining the measured value in 460 nm may be used for the measuredwavelength between 400 nm and 500 nm.

Furthermore, each measured value may be corrected by measuring distancewith the distance sensor 18 at the time of obtaining the measured valuein the measured wavelength of 700 nm and at the time of obtaining themeasured value in the measured wavelength of 400 nm and by obtaining thecorrection coefficient with respect to the average distance.

While the above embodiment illustrates the distance-intensity data asbeing stored in the memory 153, this is not for limitation purposes. Forexample, the distance-intensity data may be stored in the externalapparatus 20 connected to the printer 10 and may be obtained from theexternal apparatus 20 by, for example, wired communication or wirelesscommunication.

While the above embodiment illustrates a configuration in which the unitcontroller circuit 152 is disposed in the control unit 15, a controlunit may be disposed in each unit separately from the control unit 15 asabove. For example, a filter controller circuit that controls thewavelength-selective interference filter 5 and a light receptioncontroller circuit that controls the light receiver 172B may be disposedin the spectroscope 17. In addition, a microcomputer and a memory thatstores the V-λ data may be incorporated into the spectroscope 17, andthe microcomputer may function as the measuring controller 154C.

While the above embodiment illustrates the printing unit 16 as an inkjet type that discharges ink supplied from the ink tank by driving thepiezoelectric element, this is not for limitation purposes. For example,the printing unit 16 may discharge ink by generating an air bubble witha heater in the ink or may discharge ink with an ultrasonic vibrator.

This is not limited to an ink jet type and, for example, can be appliedto a printer of any printing type such as a thermal printer usingthermal transfer, a laser printer, and a dot impact printer.

While the above embodiment illustrates the wavelength-selectiveinterference filter 5 as a light transmitting type that transmits lightof a wavelength corresponding to the gap G between the reflecting films54 and 55 from incident light, this is not for limitation purposes. Forexample, a light reflecting wavelength-selective interference filterthat reflects light of a wavelength corresponding to the gap G betweenthe reflecting films 54 and 55 may be used. In addition, other types ofwavelength-selective filters may be used.

While the above embodiment illustrates the spectroscopy device 172A inwhich the wavelength-selective interference filter 5 is accommodated inthe casing 6, for example, the wavelength-selective interference filter5 may be directly disposed in the spectroscope 17.

While the wavelength-selective interference filter 5 is illustrated as aspectroscopy element, this is not for limitation purposes. For example,a grating, an AOTF, or an LCTF may be used as a spectroscopy element.

While the above embodiment illustrates a configuration (post-dispersivespectroscopy) in which the spectroscopy device 172A including thewavelength-selective interference filter 5 is disposed in the lightreceiving optical system 172, this is not for limitation purposes.

For example, the wavelength-selective interference filter 5 or thespectroscopy device 172A including the wavelength-selective interferencefilter 5 may be arranged in the illumination optical system 171, and themedium A may be irradiated with light on which spectroscopy is performedwith the wavelength-selective interference filter 5 (pre-dispersivespectroscopy).

While the above embodiment illustrates the printer 10 that includes thespectrometry device, this is not for limitation purposes. For example,the spectrometry device may not include an image forming unit andperform only the colorimetry process on the medium A. The spectrometrydevice of the present disclosure may be incorporated into, for example,a quality inspecting apparatus that inspects the quality of a printedmatter manufactured in a factory or the like, or besides, thespectrometry device of the present disclosure may be incorporated intoany apparatus.

While the spectroscope 17 is illustrated by a configuration example inwhich the medium A is irradiated with light of the light source 171A inthe direction of the normal line thereof and light reflected by themedium A at 45° is incident on the wavelength-selective interferencefilter 5, this is not for limitation purposes.

For example, light may be incident on the surface of the medium A at anangle of 45°, and the light receiver 172B may receive light that isreflected by the medium A in the direction of the normal line thereofthrough the wavelength-selective interference filter 5.

While the light receiver 172B receives light reflected by the medium Aat 45° through the wavelength-selective interference filter 5, the lightreceiver 172B may receive light that is reflected at an angle other than45° such as 30°. That is, the angle of the optical axis of the lightreceiver 172B and the wavelength-selective interference filter 5 may beset so that the light receiver 172B does not receive light that isreflected by the medium A in a specular manner.

Besides, a specific structure in embodying the present disclosure may beconfigured by appropriately combining the above embodiment and themodification examples to the extent capable of achieving the advantageof the present disclosure and may be appropriately changed to otherstructures and the like.

The entire disclosure of Japanese Patent Application No. 2015-064978filed Mar. 26, 2015 is expressly incorporated by reference herein.

What is claimed is:
 1. A spectrometry device comprising: a spectroscopethat includes a spectroscopy element on which light from a measurementtarget is incident; a distance measurer that measures a distance betweenthe measurement target and the spectroscope; and a spectrometry unitthat performs spectrometry on the light by using the spectroscope,wherein the spectrometry unit corrects a measured value obtained by thespectrometry based on the distance measured by the distance measurer. 2.The spectrometry device according to claim 1, wherein: the spectroscopeincludes a light source that emits illumination light toward themeasurement target, and a first portion of light reflected by themeasurement target is incident on the spectroscopy element, and thedistance measurer receives a second portion of light reflected by themeasurement target and measures the distance between the measurementtarget and the spectroscope based on the received second portion oflight.
 3. The spectrometry device according to claim 1, wherein: thespectrometry unit corrects the measured value based on the distance thatis measured by the distance measurer at a time at which the measuredvalue from the spectrometry is obtained.
 4. The spectrometry deviceaccording to claim 1, wherein: the spectrometry unit obtainsdistance-intensity data in which the amount of change in light intensityis recorded with respect to the distance between the measurement targetand the spectroscope, and corrects the measured value based on thedistance-intensity data.
 5. The spectrometry device according to claim4, wherein: the spectrometry unit obtains the distance-intensity datathat corresponds to each of a plurality of wavelengths and corrects themeasured value based on the distance-intensity data that corresponds toa wavelength in which spectroscopy is performed by the spectroscopyelement.
 6. The spectrometry device according to claim 1, wherein: thespectroscopy element is a wavelength-selective Fabry-Pérot etalonelement.
 7. An image forming apparatus comprising: the spectrometrydevice according to claim 1; and an image forming unit that forms animage on an image formation target.
 8. An image forming apparatuscomprising: the spectrometry device according to claim 2; and an imageforming unit that forms an image on an image formation target.
 9. Animage forming apparatus comprising: the spectrometry device according toclaim 3; and an image forming unit that forms an image on an imageformation target.
 10. An image forming apparatus comprising: thespectrometry device according to claim 4; and an image forming unit thatforms an image on an image formation target.
 11. An image formingapparatus comprising: the spectrometry device according to claim 5; andan image forming unit that forms an image on an image formation target.12. An image forming apparatus comprising: the spectrometry deviceaccording to claim 6; and an image forming unit that forms an image onan image formation target.
 13. A spectrometry method for a spectrometrydevice including a spectroscope that includes a spectroscopy element onwhich light from a measurement target is incident and a distancemeasurer that measures a distance between the measurement target and thespectroscope, the method comprising: performing, by the spectroscope, aspectrometry process on the light to obtain a measured value; measuring,by the distance measurer, a distance between the measurement target andthe spectroscope; and correcting the measured value based on thedistance measured.